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SEE on Different Layers of Stacked-SRAMs

2015

International audience; This paper presents heavy-ion and proton radiation test results of a 90 nm COTS SRAM with stacked structure. Radiation tests were made using high penetration heavy-ion cocktails at the HIF (Belgium) and at RADEF (Finland) as well as low energy protons at RADEF. The heavy-ion SEU cross-section showed an unusual profile with a peak at the lowest LET (heavy-ion with the highest penetration range). The discrepancy is due to the fact that the SRAM is constituted of two vertically stacked dice. The impact of proton testing on the response of both stacked dice is presented. The results are discussed and the SEU cross-sections of the upper and lower layers are compared. The …

Nuclear and High Energy PhysicsSEE rateMaterials scienceProtonDiceRadiationLow energyProton radiation90 nmElectronic engineering90 nmStatic random-access memoryElectrical and Electronic Engineeringradiation testingstacked dice[PHYS]Physics [physics]single event upset (SEU)ta213ta114business.industrymultiple cell upset (MCU)SRAM[SPI.TRON]Engineering Sciences [physics]/ElectronicsRadiation testingNuclear Energy and EngineeringOptoelectronicsbusinessstatic and dynamic mode testingIEEE Transactions on Nuclear Science
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